• Air Quality Monitoring Solutions Displayed at European Aerosol Conference

    Air quality monitoring

    Air Quality Monitoring Solutions Displayed at European Aerosol Conference

    Proven solutions for air quality monitoring, including systems for asbestos testing to NIOSH traceability standards, and compact, environmentally friendly options for particle/aerosol counting and sizing, was on display at the Copley Scientific (UK) stand at the European Aerosol Conference (EAC 2013), 1-6 September, Prague, Czech Republic. Experts from the company were on hand throughout the event to advise on the best technology for specific applications and to meet legislative requirements.

    The Model 7400 AD real-time fibre monitor is a compact, field portable unit, suitable for airborne fibres such as asbestos, mineral wool, advanced composites, ceramic and glass. Developed by MSP Corporation, Copley Scientific’s partner in North America, it offers traceability to NIOSH Method 7400 for asbestos testing and delivers up to eight hours of uninterrupted, automatic and fully customisable air safety monitoring. It is suitable for use in manufacturing operations and during asbestos removal.

    Also on display was the M1110, a water-based condensation particle counter (WCPC), and the wide range particle spectrometer (WPS). Used in clean rooms, environmental science applications, high purity gas systems and other air sampling applications, the M1110 WCPC employs innovative single-flow mixing technology to give superior counting at high particle concentrations and is valued for its environmental credentials –  no butanol used as a working fluid and highly efficient HEPA filters.

    The WPS is ideal for applications that require aerosol sizing and counting and uses an electrical ioniser to neutralise particle charge prior to differential mobility analysis (DMA) rather than a radioactive source. The WPS combines DMA and condensation particle counting with laser light scattering in a single instrument, to deliver a measurement range of 5 nm to 10 microns.


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